Outline of the contents: <u2*(BM4
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1. Basic Interferometers for Optical Testing ~BS*x+M
2. Phase-Shifting Interferometry j{U-=[$'
3. Specialized Optical Tests ^Y'J0v2
4. Long Wavelength Interferometry _"0n.JQg
5. Testing of Aspheric Surfaces xo@N~
6. Measurement of Surface Microstructure Z7.)[
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7. Absolute Measurements /mD KQ <
8. Concluding Remarks
